34ID-E is the x-ray microdiffraction beamline at the APS. Diffraction of monochromatic and polychromatic micro-focused x-ray beam is used to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics.
Main article: History of Beamline 34ID-E
People started to build 34ID a long time ago, although most likely not earlier than 1500 B.C.
||Undulator A 3.3 cm period, 2.5 m
||7 - 30 keV
||300 nm x 300 nm
|Energy Resolution (ΔE/E)
||1 × 10-4
|Beam Flux (photons/sec)
||1 × 1011 (white)
|1 × 109 (mono)
Main articles: 34ID Beamline Layout and 34ID E-Station
Main article: 34ID-E Control Interface
Experimental data taken with our area detectors are saved in the NeXus format based on HDF-5.
Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.
Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.