Overview
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34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).
The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.
34ID-E is part of Sector 34ID, which has, after a canting upgrade in 2011, two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for coherent diffraction imaging experiments.
The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.
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| Beam Parameters
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| Source Type |
Undulator A, 3.3 cm period, 2.2 m
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| Energy Range |
7 - 30 keV
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| Beam Size |
300 - 500 nm (H) × 300 - 700 nm (V)
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| Energy Resolution (ΔE/E) |
1 × 10-4
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| Beam Flux (photons/sec)
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1 × 1011 (white)
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| 1 × 109 (mono)
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| Contacts
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(Beamline Diagram to be placed here)
Instruments
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Miscellaneous
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Beamline Control
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Data Analysis
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- Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.
- Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.
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External Links
