34ID-E is the x-ray microdiffraction beamline at the Advanced Photon Source. Diffraction of monochromatic and polychromatic micro-focused x-ray beam is used to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics.
