34-ID-E

Welcome to 34ID-E Wiki.

34ID-E is the x-ray microdiffraction beamline at the APS. Diffraction of monochromatic and polychromatic micro-focused x-ray beam is used to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics.

History

Main article: History of Beamline 34ID-E

People started to build 34ID a long time ago, although most likely not earlier than 1500 B.C.

Overview

Beam Parameters

Source Type	Undulator A 3.3 cm period, 2.5 m
Energy Range	7 - 30 keV
Beam Size	300 nm x 300 nm
Energy Resolution (ΔE/E)	1 × 10-4
Beam Flux (photons/sec)	1 × 1011 (white)
	1 × 109 (mono)

Contacts

• Wenjun Liu
• Ruqing Xu
• Jon Tischler (Group Leader)

Instrumentation

Main articles: 34ID Beamline Layout and 34ID E-Station

Controls

Main article: 34ID-E Control Interface

Data Analysis

See: LaueGo

Experimental data taken with our area detectors are saved in the NeXus format based on HDF-5.

Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.

Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.

External Links

• 34ID-E Homepage
• 34ID-E real-time status page
• Surface Scattering and Microdiffraction Group
• Advanced Photon Source and Argonne National Laboratory
• APS Beamline Directory and Phone Numbers