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34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).
The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.
34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments.
The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.
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