34-ID-E
Welcome to the 34ID-E wiki! This is the main page.
Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
Overview
Beam Parameters
Contacts
Instrumentation
Main articles: 34ID Beamline Layout and 34ID E-Station
Operations
Data Analysis
See: LaueGo
Experimental data taken with our area detectors are saved in the NeXus format based on HDF-5.
Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.
Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.
