Difference between revisions of "34-ID-E"

From 34-ID-E
Jump to navigationJump to search
Line 27: Line 27:
|style="width:65%;vertical-align:top;"|
|style="width:65%;vertical-align:top;"|


34ID-E is an [[wikipedia:undulator | undulator]] [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] dedicated to x-ray micro/nano-diffraction activities at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]] (APS).  
34ID-E is an [[wikipedia:undulator | undulator]] [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] dedicated to [[wikipedia:x-ray|x-ray]] micro/nano-diffraction activities at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]] (APS).  


The x-ray micro/nano-diffraction facility [[X-ray Focusing at 34ID-E | focuses]] x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.  
The x-ray micro/nano-diffraction facility [[X-ray Focusing at 34ID-E | focuses]] x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.  
Line 33: Line 33:
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  


34ID-E is part of Sector 34ID of the APS. After a canting upgrade in 2011, Sector 34ID now has two independent undulators placed in tandem along the storage ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.
34ID-E is part of Sector 34ID which, after a canting upgrade in 2011, has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.


The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].  
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].  

Revision as of 17:06, 9 August 2013


Welcome to 34ID-E Wiki.

Overview

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

34ID-E is part of Sector 34ID which, after a canting upgrade in 2011, has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Beam Parameters
Source Type Undulator A, 3.3 cm period, 2.2 m
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H) × 300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
Contacts

Instruments


Miscellaneous

Beamline Control

Data Analysis

  • Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.
  • Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.


External Links

Retrieved from "https://wiki-ext.aps.anl.gov/s34ide/index.php?title=34-ID-E&oldid=78"