Difference between revisions of "34-ID-E"

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34ID-E is the x-ray microdiffraction [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]]. Diffraction of monochromatic and polychromatic [[X-ray Focusing at 34ID-E | micro-focused]] x-ray beam is used to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics.
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* 34ID-E is the inboard branch of Sector 34ID, which is a canted sector with two independent [[wikipedia:undulator | undulators]] positioned in tandem along the synchrotron ring. X-rays generated by them are horizontally separated, and the ourboard branch is used by 34ID-C for coherent diffraction imaging experiments.
 
* 3D spatial resolution is achieved via the [[differential aperture]].
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34ID-E is an [[wikipedia:undulator | undulator]] [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] dedicated to x-ray micro/nano-diffraction activities at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]].
 
The x-ray micro/nano-diffraction facility [[X-ray Focusing at 34ID-E | focuses]] x-ray beam to smaller than 0.5&mu;m &times; 0.5&mu;m for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.
 
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-&mu;m resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.
 
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].
 
34ID-E is the inboard branch of Sector 34ID, which is a canted sector with two independent [[wikipedia:undulator | undulators]] positioned in tandem along the synchrotron ring. X-rays generated by them are horizontally separated, and the ourboard branch is used by 34ID-C for coherent diffraction imaging experiments.
 
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|style="border:1px solid #ddd;" |Source Type ||style="border:1px solid #ddd;" | Undulator A 3.3 cm period, 2.5 m
|Source Type || Undulator A, 3.3 cm period, 2.2 m
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|Energy Range || 7 - 30 keV
|Energy Range || 7 - 30 keV
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|Beam Size || 300 nm x 300 nm
|Beam Size || 300 - 500 nm (H) &times; 300 - 700 nm (V)
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|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
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|'''Contacts'''
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* Wenjun Liu
* [[User:Ruqingxu | Ruqing Xu]]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler] (Group Leader)
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== Overview ==
=== Beam Parameters ===
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|Source Type || Undulator A 3.3 cm period, 2.5 m
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|Energy Range || 7 - 30 keV
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|Beam Size || 300 nm x 300 nm
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|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
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|rowspan="2"|Beam Flux (photons/sec)
|1 &times; 10<sup>11</sup> (white)
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|1 &times; 10<sup>9</sup> (mono)
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=== Contacts ===
* Wenjun Liu
* [[User:Ruqingxu | Ruqing Xu]]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler] (Group Leader)




Revision as of 03:33, 9 August 2013


Welcome to 34ID-E Wiki.

Overview

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source.

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

34ID-E is the inboard branch of Sector 34ID, which is a canted sector with two independent undulators positioned in tandem along the synchrotron ring. X-rays generated by them are horizontally separated, and the ourboard branch is used by 34ID-C for coherent diffraction imaging experiments.

Beam Parameters
Source Type Undulator A, 3.3 cm period, 2.2 m
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H) × 300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
Contacts

Instruments


Miscellaneous

Beamline Control

Data Analysis

  • Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.
  • Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.


External Links

Retrieved from "https://wiki-ext.aps.anl.gov/s34ide/index.php?title=34-ID-E&oldid=75"