Difference between revisions of "34-ID-E"
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Revision as of 16:42, 8 August 2013
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Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
History
Main article: History of Beamline 34ID-E
People started to build 34ID a long time ago, although most likely not earlier than 1500 B.C.
Overview
Beam Parameters
| Source Type | Undulator A 3.3 cm period, 2.5 m |
| Energy Range | 7 - 30 keV |
| Beam Size | 300 nm x 300 nm |
| Energy Resolution (ΔE/E) | 1 × 10-4 |
| Beam Flux (photons/sec) | 1 × 1011 (white) |
| 1 × 109 (mono) |
Contacts
- Wenjun Liu
- Ruqing Xu
- Jon Tischler
Instrumentation
Main articles: 34ID Beamline Layout and 34ID E-Station
Operations
Main article: 34ID-E Control Interface
Data Analysis
See: LaueGo
Experimental data taken with our area detectors are saved in the NeXus format based on HDF-5.
Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.
Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.
