Difference between revisions of "34-ID-E"

From 34-ID-E
Jump to navigationJump to search
m
m
 
(9 intermediate revisions by the same user not shown)
Line 11: Line 11:
</div>
</div>
|}
|}
| style="width:30%; font-size:95%;" |
| style="width:15%;text-align:right;padding-right:20px;" |'''Contacts:'''
<div></div>
| style="width:15%;" |
* Wenjun Liu
* [[User:Ruqingxu | Ruqing Xu]]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler]
|} <!-- END of Welcome Banner -->
|} <!-- END of Welcome Banner -->


Line 21: Line 24:
| style="padding:2px;" | <h2 id="mp-tfp-h2" style="margin:3px; background:#ddcef2; font-size:120%; font-weight:bold; border:1px solid #afa3bf; text-align:left; color:#000; padding:0.2em 0.4em">Overview</h2>
| style="padding:2px;" | <h2 id="mp-tfp-h2" style="margin:3px; background:#ddcef2; font-size:120%; font-weight:bold; border:1px solid #afa3bf; text-align:left; color:#000; padding:0.2em 0.4em">Overview</h2>
|-
|-
| style="color:#000; padding:2px 5px;" |  
| style="color:#000; padding:2px 10px 5px 10px;" |  
<!-- Contents of the Overview Panel begins here -->
<!-- Contents of the Overview Panel begins here -->


{|style="width:100%;background:none;vertical-align:top;"
[[Image:34ide-outview.jpg | right | border |350px]]
|style="width:65%;vertical-align:top;"|
 
34ID-E is an [[wikipedia:undulator | undulator]] [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] dedicated to [[wikipedia:x-ray|x-ray]] micro/nano-diffraction activities at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]] (APS).  
34ID-E is an [[wikipedia:undulator | undulator]] [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] dedicated to [[wikipedia:x-ray|x-ray]] micro/nano-diffraction activities at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]] (APS).  


Line 33: Line 34:
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-&mu;m resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-&mu;m resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  


34ID-E is part of Sector 34ID, which has, after a canting upgrade in 2011, two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.
34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.


The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].  
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].  
<!-- Contents of the Overview Panel ends here -->
|}
|}
<!-- END of Overview Panel -->


|style="width:30%;"|
<!-- Instrument Panel -->
{|style="width:100%;background:none;padding: 2px 20px;"
{| id="mp-ins" style="margin:4px 0 0 0; width:100%; background:none; border-spacing: 0px;"
|'''Beam Parameters'''
| class="MainPageBG" style="width:100%; border:1px solid #ddd; background:#fff; vertical-align:top; color:#000;" |
{| id="mp-ins-main" style="width:100%; vertical-align:top; background:#fff; color:#000;"
| style="padding:2px;" colspan=2 | <h2 id="mp-tfl-h2" style="margin:3px; background:#ddd; font-size:120%; font-weight:bold; border:1px solid #aaa; text-align:left; color:#000; padding:0.2em 0.4em">Instruments</h2>
|-
|-
|
| style="color:#000; padding:2px 5px; vertical-align:top;" |
<!-- left part of Instrument Panel -->
<div style="padding-left:80px;">'''Beam Parameters'''</div>
<!-- Beam Parameters Table -->
<!-- Beam Parameters Table -->
{|border="1" cellpadding="4" cellspacing="0" style="width:100%;margin:1em 1em 1em 0; background:none; border:2px #aaa solid;border-collapse: collapse;"
{|border="1" cellpadding="4" cellspacing="0" style="width:300px;margin:1em 1em 1em 0; background:none; border:2px #aaa solid;border-collapse: collapse;"
|-   
|-   
|Source Type || Undulator A, 3.3 cm period, 2.2 m
|Source Type || Undulator A, 3.3 cm
|-  
|-  
|Energy Range || 7 - 30 keV
|Energy Range || 7 - 30 keV
|-  
|-  
|Beam Size || 300 - 500 nm (H) &times; 300 - 700 nm (V)
|Beam Size || 300 - 500 nm (H) <br> 300 - 700 nm (V)
|-  
|-  
|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
Line 59: Line 68:
|}
|}
<!-- END Beam Parameters Table -->
<!-- END Beam Parameters Table -->
<!-- END left part of Instrument Panel -->
|
<!-- right part of Instrument Panel -->
<!-- Beamline Diagram -->
{| style="border-collapse:collapse;padding:0"
|-
|style="padding:0;"|[[Image:34ide-diagram-topleft.png|link=]]
|style="padding:10px;"| [[34ID-E Detectors | Detectors]]
|colspan=2|
<div>''Main Articles:''</div>
* '''[[34ID Beamline Layout]]'''
* '''[[34ID-E Experiment Station]]'''
|-
|-
|'''Contacts'''
|style="padding:0;"|[[Image:34ide-diagram-left.png|link=]]
|style="padding:0;" colspan="3"|[[Image:34ide-diagram-right.png|link=]]
|style="text-align:center"|[[ff | Undulator<br>Source]]
|-
|-
|
|style="text-align:right;padding:0px 70px 10px 0px;"|[[Differential Aperture]]
* Wenjun Liu
|style="width:240px;"|[[X-ray Focusing at 34ID-E | Focusing Mirrors]]
* [[User:Ruqingxu | Ruqing Xu]]
|style="width:100px;text-align:center;vertical-align:top"|[[Monochromator of 34ID-E | Removable<br>Monochromator]]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler] (Group Leader)
|style="visibility:hidden;"| empty cell
 
|}
|}
|}
<!-- Contents of the Overview Panel ends here -->
<!-- END Beamline Diagram -->
<!-- END right part of Instrument Panel -->
|}
|}
|}
|}
<!-- End of Overview Panel -->
<!-- END of Instrument Panel -->
 
<!-- Beamline Diagram -->


  (Beamline Diagram to be placed here)


<!-- Boxes of Categories -->  
<!-- Boxes of Categories -->  
<!-- derived from Wikipedia's TODAY'S FEATURED CONTENT  -->
<!-- derived from Wikipedia's TODAY'S FEATURED CONTENT  -->
{| id="mp-upper" style="width: 100%; margin:4px 0 0 0; background:none; border-spacing: 0px;"
{| id="mp-cat" style="width: 100%; margin:4px 0 0 0; background:none; border-spacing: 0px;"
<!-- Left Part -->
<!-- Left Part -->
| class="MainPageBG" style="width:50%; border:1px solid #cedff2; background:#f5faff; vertical-align:top;"|
| class="MainPageBG" style="width:50%; border:1px solid #cedff2; background:#f5faff; vertical-align:top;"|
{| id="mp-left" style="width:100%; vertical-align:top; background:#f5faff;"
{| id="mp-cat-left" style="width:100%; vertical-align:top; background:#f5faff;"
| style="padding:2px;" | <h2 id="mp-itn-h2" style="margin:3px; background:#cedff2; font-size:120%; font-weight:bold; border:1px solid #a3b0bf; text-align:left; color:#000; padding:0.2em 0.4em;">Instruments</h2>
| style="padding:2px;" | <h2 id="mp-itn-h2" style="margin:3px; background:#cedff2; font-size:120%; font-weight:bold; border:1px solid #a3b0bf; text-align:left; color:#000; padding:0.2em 0.4em;">General Info</h2>
|-
| style="color:#000; padding:2px 5px;" |
 
* [[34ID Beamline Layout]]
* [[34ID-E Experiment Station]]
* [[34ID-E Detectors]]
 
 
|-
| style="padding:2px;" | <h2 id="mp-otd-h2" style="margin:3px; background:#cedff2; font-size:120%; font-weight:bold; border:1px solid #a3b0bf; text-align:left; color:#000; padding:0.2em 0.4em;">Miscellaneous</h2>
|-
|-
| style="color:#000; padding:2px 5px 5px;" |
| style="color:#000; padding:2px 5px 5px;" |


* Who built 34ID-E? Is the beamline more than 300 years old? ''See: [[History of Beamline 34ID-E]]''
* Who built 34ID-E? Is the beamline more than 300 years old? ''See: [[History of Beamline 34ID-E]]''
* [[34ID-E Coordinate Systems]]
* [[34ID-E Coordinate Systems]]
* [[Computing Infrastructure of 34ID-E | Beamline computing infrastructure]]
* [[References for 34ID-E | References / Review articles about 34ID-E]]
* How to [[Applying for beam time at 34ID-E | apply for beam time]]?


|}
|}
Line 115: Line 126:


|-
|-
| style="padding:2px;" | <h2 id="mp-dyk-h2" style="margin:3px; background:#cef2e0; font-size:120%; font-weight:bold; border:1px solid #a3bfb1; text-align:left; color:#000; padding:0.2em 0.4em;">Data Analysis</h2>
| style="padding:2px;" | <h2 id="mp-dyk-h2" style="margin:3px; background:#cef2e0; font-size:120%; font-weight:bold; border:1px solid #a3bfb1; text-align:left; color:#000; padding:0.2em 0.4em;">[[34ID-E Data Analysis Overview|Data Analysis]]</h2>
|-
|-
| style="color:#000; padding:2px 5px 5px;" |  
| style="color:#000; padding:2px 5px 5px;" |  


* Experimental data taken with our [[34ID-E Detectors|area detectors]] are saved in the [http://www.nexusformat.org/ NeXus format] based on [[wikipedia:Hierarchical Data Format | HDF-5]].
* [[34ID-E Data Analysis Overview | Data Analysis Overview]]


* Analysis and visualization are mostly done with '''[[LaueGo]]''', a package developed at 34ID-E based on [[IGOR Pro]], runs on any PC or Mac.
* '''[[LaueGo]]''', main data analysis package based on [[IGOR Pro]].


* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]], which is carried out by a multi-node Linux cluster at APS.
* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]].


|}
|}

Latest revision as of 21:21, 19 August 2013


Welcome to 34ID-E Wiki.

Contacts:

Overview

34ide-outview.jpg

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Instruments

Beam Parameters
Source Type Undulator A, 3.3 cm
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H)
300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
34ide-diagram-topleft.png Detectors
Main Articles:
34ide-diagram-left.png 34ide-diagram-right.png Undulator
Source
Differential Aperture Focusing Mirrors Removable
Monochromator 		empty cell


General Info

Beamline Control

Data Analysis


External Links

Retrieved from "https://wiki-ext.aps.anl.gov/s34ide/index.php?title=34-ID-E&oldid=142"