Difference between revisions of "34-ID-E"

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'''Welcome to the 34ID-E wiki!''' This is the main page.
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Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
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Welcome to 34ID-E Wiki.
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| style="width:15%;text-align:right;padding-right:20px;" |'''Contacts:'''
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* Wenjun Liu
* [[User:Ruqingxu | Ruqing Xu]]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler]
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The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
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== History ==
[[Image:34ide-outview.jpg | right | border |350px]]
34ID-E is an [[wikipedia:undulator | undulator]] [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] dedicated to [[wikipedia:x-ray|x-ray]] micro/nano-diffraction activities at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]] (APS).


''Main article: [[History of Beamline 34ID-E]]''
The x-ray micro/nano-diffraction facility [[X-ray Focusing at 34ID-E | focuses]] x-ray beam to smaller than 0.5&mu;m &times; 0.5&mu;m for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.


People started to build 34ID a long time ago, although most likely not earlier than 1500 B.C.
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-&mu;m resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  


== Overview ==
34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.


=== Beam Parameters ===
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].
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|Source Type || Undulator A 3.3 cm period, 2.5 m
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<div style="padding-left:80px;">'''Beam Parameters'''</div>
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|Source Type || Undulator A, 3.3 cm
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|Energy Range || 7 - 30 keV
|Energy Range || 7 - 30 keV
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|Beam Size || 300 nm x 300 nm
|Beam Size || 300 - 500 nm (H) <br> 300 - 700 nm (V)
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|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
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|1 &times; 10<sup>9</sup> (mono)
|1 &times; 10<sup>9</sup> (mono)
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|style="padding:0;"|[[Image:34ide-diagram-topleft.png|link=]]
|style="padding:10px;"| [[34ID-E Detectors | Detectors]]
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<div>''Main Articles:''</div>
* '''[[34ID Beamline Layout]]'''
* '''[[34ID-E Experiment Station]]'''
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|style="text-align:center"|[[ff | Undulator<br>Source]]
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|style="text-align:right;padding:0px 70px 10px 0px;"|[[Differential Aperture]]
|style="width:240px;"|[[X-ray Focusing at 34ID-E | Focusing Mirrors]]
|style="width:100px;text-align:center;vertical-align:top"|[[Monochromator of 34ID-E | Removable<br>Monochromator]]
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=== Contacts ===


* Wenjun Liu
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* [[User:Ruqingxu | Ruqing Xu]]
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* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler]
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== Instrumentation ==
* Who built 34ID-E? Is the beamline more than 300 years old? ''See: [[History of Beamline 34ID-E]]''
''Main articles: [[34ID Beamline Layout]] and [[34ID E-Station]]''
* [[34ID-E Coordinate Systems]]
* [[Computing Infrastructure of 34ID-E | Beamline computing infrastructure]]
* [[References for 34ID-E | References / Review articles about 34ID-E]]
* How to [[Applying for beam time at 34ID-E | apply for beam time]]?


== Operations ==
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''Main article: [[34ID-E Control Interface]]''
* [http://www.aps.anl.gov/epics/ EPICS]
* [[34ID-E Control Interface]]
 
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== Data Analysis ==
* [[34ID-E Data Analysis Overview | Data Analysis Overview]]


''See: [[LaueGo]]''
* '''[[LaueGo]]''', main data analysis package based on [[IGOR Pro]].


Experimental data taken with our area detectors are saved in the [http://www.nexusformat.org/ NeXus format] based on [http://en.wikipedia.org/wiki/Hierarchical_Data_Format HDF-5].
* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]].


Analysis and visualization are mostly done with '''[[LaueGo]]''', a package developed at 34ID-E based on [[IGOR Pro]], runs on any PC or Mac.
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Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]], which is carried out by a multi-node Linux cluster at APS.


== External Links ==
== External Links ==

Latest revision as of 21:21, 19 August 2013


Welcome to 34ID-E Wiki.

Contacts:

Overview

34ide-outview.jpg

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Instruments

Beam Parameters
Source Type Undulator A, 3.3 cm
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H)
300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
34ide-diagram-topleft.png Detectors
Main Articles:
34ide-diagram-left.png 34ide-diagram-right.png Undulator
Source
Differential Aperture Focusing Mirrors Removable
Monochromator 		empty cell


General Info

Beamline Control

Data Analysis


External Links

Retrieved from "https://wiki-ext.aps.anl.gov/s34ide/index.php?title=34-ID-E&oldid=142"