Difference between revisions of "34-ID-E"

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Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  


34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.
34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.


The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].  
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].  
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* Who built 34ID-E? Is the beamline more than 300 years old? ''See: [[History of Beamline 34ID-E]]''
* Who built 34ID-E? Is the beamline more than 300 years old? ''See: [[History of Beamline 34ID-E]]''
* [[34ID-E coordinate systems]]
* [[34ID-E Coordinate Systems]]
* [[Computing Infrastructure of 34ID-E | Beamline computing infrastructure]]
* [[Computing Infrastructure of 34ID-E | Beamline computing infrastructure]]
* [[References for 34ID-E | References / Review articles about 34ID-E]]
* [[References for 34ID-E | References / Review articles about 34ID-E]]
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| style="padding:2px;" | <h2 id="mp-dyk-h2" style="margin:3px; background:#cef2e0; font-size:120%; font-weight:bold; border:1px solid #a3bfb1; text-align:left; color:#000; padding:0.2em 0.4em;">Data Analysis</h2>
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* Experimental data taken with our [[34ID-E Detectors|area detectors]] are saved in the [http://www.nexusformat.org/ NeXus format] based on [[wikipedia:Hierarchical Data Format | HDF-5]].
* [[34ID-E Data Analysis Overview | Data Analysis Overview]]


* Analysis and visualization are mostly done with '''[[LaueGo]]''', a package developed at 34ID-E based on [[IGOR Pro]], runs on any PC or Mac.
* '''[[LaueGo]]''', main data analysis package based on [[IGOR Pro]].


* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]], which is carried out by a multi-node Linux cluster at APS.
* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]].


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Latest revision as of 21:21, 19 August 2013


Welcome to 34ID-E Wiki.

Contacts:

Overview

34ide-outview.jpg

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Instruments

Beam Parameters
Source Type Undulator A, 3.3 cm
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H)
300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
34ide-diagram-topleft.png Detectors
Main Articles:
34ide-diagram-left.png 34ide-diagram-right.png Undulator
Source
Differential Aperture Focusing Mirrors Removable
Monochromator 		empty cell


General Info

Beamline Control

Data Analysis


External Links

Retrieved from "https://wiki-ext.aps.anl.gov/s34ide/index.php?title=34-ID-E&oldid=142"