Difference between revisions of "34-ID-E"

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Welcome to 34ID-E Wiki.
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| style="width:15%;text-align:right;padding-right:20px;" |'''Contacts:'''
| style="width:15%;" |
* Wenjun Liu
* [[User:Ruqingxu | Ruqing Xu]]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler]
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[[Image:34ide-outview.jpg | right | border |350px]]
34ID-E is an [[wikipedia:undulator | undulator]] [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] dedicated to [[wikipedia:x-ray|x-ray]] micro/nano-diffraction activities at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]] (APS).
 
The x-ray micro/nano-diffraction facility [[X-ray Focusing at 34ID-E | focuses]] x-ray beam to smaller than 0.5&mu;m &times; 0.5&mu;m for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.
 
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-&mu;m resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.
 
34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.
 
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].
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<div style="padding-left:80px;">'''Beam Parameters'''</div>
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|Source Type || Undulator A, 3.3 cm
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|Energy Range || 7 - 30 keV
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|Beam Size || 300 - 500 nm (H) <br> 300 - 700 nm (V)
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|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
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|rowspan="2"|Beam Flux (photons/sec)
|1 &times; 10<sup>11</sup> (white)
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|1 &times; 10<sup>9</sup> (mono)
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|style="padding:10px;"| [[34ID-E Detectors | Detectors]]
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<div>''Main Articles:''</div>
* '''[[34ID Beamline Layout]]'''
* '''[[34ID-E Experiment Station]]'''
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|style="padding:0;"|[[Image:34ide-diagram-left.png|link=]]
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|style="text-align:center"|[[ff | Undulator<br>Source]]
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|style="text-align:right;padding:0px 70px 10px 0px;"|[[Differential Aperture]]
|style="width:240px;"|[[X-ray Focusing at 34ID-E | Focusing Mirrors]]
|style="width:100px;text-align:center;vertical-align:top"|[[Monochromator of 34ID-E | Removable<br>Monochromator]]
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* Who built 34ID-E? Is the beamline more than 300 years old? ''See: [[History of Beamline 34ID-E]]''
* [[34ID-E Coordinate Systems]]
* [[Computing Infrastructure of 34ID-E | Beamline computing infrastructure]]
* [[References for 34ID-E | References / Review articles about 34ID-E]]
* How to [[Applying for beam time at 34ID-E | apply for beam time]]?
 
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* [http://www.aps.anl.gov/epics/ EPICS]
* [[34ID-E Control Interface]]
 
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* [[34ID-E Data Analysis Overview | Data Analysis Overview]]
 
* '''[[LaueGo]]''', main data analysis package based on [[IGOR Pro]].
 
* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]].
 
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== External Links ==
*[http://www.aps.anl.gov/Sectors/33_34/microdiff/index.html 34ID-E Homepage]
*[http://sector33.xray.aps.anl.gov/34ide/status.cgi 34ID-E real-time status page]
*[http://www.aps.anl.gov/Sectors/33_34/ Surface Scattering and Microdiffraction Group]
*[http://www.aps.anl.gov/ Advanced Photon Source] and [http://www.anl.gov Argonne National Laboratory]
*[http://www.aps.anl.gov/Beamlines/Directory/ APS Beamline Directory] and [http://www.aps.anl.gov/Beamlines/Phone_Directory/ Phone Numbers]

Latest revision as of 21:21, 19 August 2013


Welcome to 34ID-E Wiki.

Contacts:

Overview

34ide-outview.jpg

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Instruments

Beam Parameters
Source Type Undulator A, 3.3 cm
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H)
300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
34ide-diagram-topleft.png Detectors
Main Articles:
34ide-diagram-left.png 34ide-diagram-right.png Undulator
Source
Differential Aperture Focusing Mirrors Removable
Monochromator 		empty cell


General Info

Beamline Control

Data Analysis


External Links

Retrieved from "https://wiki-ext.aps.anl.gov/s34ide/index.php?title=34-ID-E&oldid=142"