Difference between revisions of "34-ID-E"
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Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains. | Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains. | ||
34ID-E is part of Sector 34ID | 34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments. | ||
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]]. | The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]]. |
Revision as of 16:17, 14 August 2013
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