Difference between revisions of "Temp"
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<math> | <math>\text {abcdefghijklmnopqrstuvwxyzàáâãäåæçčďèéěêëìíîïňñòóôõöřšť÷øùúůûüýÿž}</math> | ||
Constant Wavelength X-ray GSAS Profile Type 3 | Constant Wavelength X-ray GSAS Profile Type 3 |
Revision as of 04:11, 2 May 2012
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Constant Wavelength X-ray GSAS Profile Type 3
GU = Gaussian U term | GV = Gaussian V term | GW = Gaussian W term |
GP = Gaussian crystallite size broadening | LX = Lorentzian crystallite size broadening | LY = Lorentzian strain broadening |
S/L = Finger-Cox Axial Divergence S term | H/L = Finger-Cox Axial Divergence H term | trns = sample transparency |
shft = sample displacement | stec = anisotropic strain | ptec = anisotropic crystallite size |
sfec = sublattice anisotropic broadening (stacking faults) | LXX = Lorentzian microstrain anisotropy | LYY = Lorentzian microstrain anisotropy |
Constant Wavelength X-ray GSAS Profile Type 4
GU = Gaussian U term | GV = Gaussian V term | GW = Gaussian W term |
GP = Gaussian crystallite size broadening | LX = Lorentzian crystallite size broadening | ptec = anisotropic crystallite size |
trns = sample transparency | shft = sample displacement | sfec = sublattice anisotropic broadening (stacking faults) |
S/L = Finger-Cox Axial Divergence S term | H/L = Finger-Cox Axial Divergence H term | eta = mixing factor, from Gaussian (0) to Lorentzian (1) |
SXXX = Stephens anisotropic microstrain broadening | SYYY = Stephens anisotropic microstrain broadening | SZZZ = Stephens anisotropic microstrain broadening |