Difference between revisions of "Standards Data"
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*[http://11bm.xray.aps.anl.gov/data/standards/LaB6/2010_1/11BM_LaB6.csv ASCII .csv format] | *[http://11bm.xray.aps.anl.gov/data/standards/LaB6/2010_1/11BM_LaB6.csv ASCII .csv format] | ||
*[http://11bm.xray.aps.anl.gov/data/standards/LaB6/2010_1/11BM_LaB6.xy Fullprof .xy format] | *[http://11bm.xray.aps.anl.gov/data/standards/LaB6/2010_1/11BM_LaB6.xy Fullprof .xy format] | ||
===Silicon (Si), NIST SRM 640c=== | |||
'''Scan Information''' | |||
*Acquired: Feb. 2010 | |||
*Wavelength: 0.41236 Å (30 keV) | |||
*Collection Temp: 295 K | |||
*2θ Range: 0.5° - 50.0° | |||
*Step Size: 0.001° | |||
*Data Points: 34000 | |||
'''Download Data''' | |||
*[http://11bm.xray.aps.anl.gov/data/standards/Si/2010_1/SiPattern.jpg Si 640c Plot (jpg)] | |||
*[http://11bm.xray.aps.anl.gov/data/standards/Si/2010_1/11BM_Si640c.fxye GSAS .fxye format] | |||
*[http://11bm.xray.aps.anl.gov/data/standards/Si/2010_1/11BM_Si640c.raw GSAS .raw format] | |||
*[http://11bm.xray.aps.anl.gov/data/standards/Si/2010_1/11BM_Si640c.xye TOPAS .xye format] | |||
*[http://11bm.xray.aps.anl.gov/data/standards/Si/2010_1/11BM_Si640c.csv ASCII .csv format] | |||
*[http://11bm.xray.aps.anl.gov/data/standards/Si/2010_1/11BM_Si640c.xy Fullprof .xy format] | |||
Revision as of 22:52, 10 May 2013
see 11BM webpage for more info: http://11bm.xor.aps.anl.gov/standards_data.html
Standard Reference Materials
Details of powder diffraction data measured at 11-BM for standard reference materials are listed below and are available in several formats.
More information about 11-BM data collection and data formats can be found here:
NIST SRM Certificates (with lattice values etc) are available for download here:
Lanthanum Hexaboride (LaB6), NIST SRM 660a
Scan Information
- Acquired: Feb. 2010
- Wavelength: 0.41223 Å (30 keV)
- Collection Temp: 295 K
- 2θ Range: 0.5° - 50.0°
- Step Size: 0.001°
- Data Points: 34000
Download Data
- LaB6 660a Plot (jpg)
- GSAS .fxye format
- GSAS .raw format
- TOPAS .xye format
- ASCII .csv format
- Fullprof .xy format
Silicon (Si), NIST SRM 640c
Scan Information
- Acquired: Feb. 2010
- Wavelength: 0.41236 Å (30 keV)
- Collection Temp: 295 K
- 2θ Range: 0.5° - 50.0°
- Step Size: 0.001°
- Data Points: 34000
Download Data
- Si 640c Plot (jpg)
- GSAS .fxye format
- GSAS .raw format
- TOPAS .xye format
- ASCII .csv format
- Fullprof .xy format
Example instrument parameter & input files for GSAS, Topas, and FullProf »
Plot of background for empty 11-BM 0.8 mm Kapton capillary (@ 30 KeV)
http://11bm.xor.aps.anl.gov/data/standards/Kapton/2010_1/11BM_Kapton.jpg
Plot of empty background (no sample or capillary)for 11-BM, air scatter only (@ 30 KeV)
http://11bm.xor.aps.anl.gov/data/standards/background/11BM_background_air_scatter.jpg
