Welcome to the 34ID-E wiki! This is the main page.
Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
Main article: History of Beamline 34ID-E
People started to build 34ID a long time ago, although most likely not earlier than 1500 B.C.
|Source Type||Undulator A 3.3 cm period, 2.5 m|
|Energy Range||7 - 30 keV|
|Beam Size||300 nm x 300 nm|
|Energy Resolution (ΔE/E)||1 × 10-4|
|Beam Flux (photons/sec)||1 × 1011 (white)|
|1 × 109 (mono)|
Main article: 34ID-E Control Interface
Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.