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Welcome to the 34ID-E wiki! This is the main page.

Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.

The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics


Beam Parameters



Main articles: 34ID Beamline Layout and 34ID E-Station


Data Analysis

See: LaueGo

Experimental data taken with our area detectors are saved in the NeXus format based on HDF-5.

Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.

Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.

External Links