34-ID-E

From 34-ID-E
Revision as of 21:38, 3 August 2013 by Ruqingxu (talk | contribs)
Jump to navigationJump to search

Welcome to 34ID-E!

Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.

The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics

Overview

Beamline Parameters

Experimental Hutch

User Operations

Contacts

Data Analysis

DataAnalysis

Reconstruction

Peak Search

Indexing

LaueGo