34-ID-E

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Welcome to 34ID-E Wiki.

34ID-E is the x-ray microdiffraction beamline at the Advanced Photon Source. Diffraction of monochromatic and polychromatic micro-focused x-ray beam is used to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics.

Overview

  • 34ID-E is the inboard branch of Sector 34ID, which is a canted sector with two independent undulators positioned in tandem along the synchrotron ring. X-rays generated by them are horizontally separated, and the ourboard branch is used by 34ID-C for coherent diffraction imaging experiments.
  • 3D spatial resolution is achieved via the differential aperture.
Beam Parameters
Contacts
Source Type Undulator A 3.3 cm period, 2.5 m
Energy Range 7 - 30 keV
Beam Size 300 nm x 300 nm
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)

Instrumentation


Miscellaneous

Beamline Control

Data Analysis

  • Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.
  • Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.


Overview

Beam Parameters

Source Type Undulator A 3.3 cm period, 2.5 m
Energy Range 7 - 30 keV
Beam Size 300 nm x 300 nm
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)

Contacts


External Links