Difference between revisions of "34-ID-E"

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'''Welcome to 34ID-E!'''
Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
==Overview==
==Beamline Parameters==
==Experimental Hutch==
==User Operations==
==Contacts==
== Data Analysis ==
[[DataAnalysis]]
{{DataAnalysis}}
{{DataAnalysis}}

Revision as of 21:38, 3 August 2013

Welcome to 34ID-E!

Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.

The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics

Overview

Beamline Parameters

Experimental Hutch

User Operations

Contacts

Data Analysis

DataAnalysis

Reconstruction

Peak Search

Indexing

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