Difference between revisions of "34-ID-E"

From 34-ID-E
Jump to navigationJump to search
m
 
(29 intermediate revisions by the same user not shown)
Line 1: Line 1:
'''Welcome to the 34ID-E wiki!''' This is the main page.
<!-- Page Markup: no table of contents; -->
__NOTOC__


Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
<!-- Welcome Banner -->
{| style="width:100%; background:#f9f9f9; margin:1.2em 0 6px 0; border:1px solid #ddd;"
| style="width:70%; color:#000;" |
{| style="width:280px; height:90px; border:none; background:none;"
| style="width:280px; text-align:center; white-space:nowrap; color:#000;" |
<div style="font-size:162%; border:none; margin:0; padding:.1em; color:#000;">
Welcome to 34ID-E Wiki.
</div>
|}
| style="width:15%;text-align:right;padding-right:20px;" |'''Contacts:'''
| style="width:15%;" |
* Wenjun Liu
* [[User:Ruqingxu | Ruqing Xu]]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler]
|} <!-- END of Welcome Banner -->


The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
<!-- Overview Panel -->
{| id="mp-mid" style="margin:4px 0 0 0; width:100%; background:none; border-spacing: 0px;"
| class="MainPageBG" style="width:100%; border:1px solid #ddcef2; background:#faf5ff; vertical-align:top; color:#000;" |
{| id="mp-bottom" style="width:100%; vertical-align:top; background:#faf5ff; color:#000;"
| style="padding:2px;" | <h2 id="mp-tfp-h2" style="margin:3px; background:#ddcef2; font-size:120%; font-weight:bold; border:1px solid #afa3bf; text-align:left; color:#000; padding:0.2em 0.4em">Overview</h2>
|-
| style="color:#000; padding:2px 10px 5px 10px;" |
<!-- Contents of the Overview Panel begins here -->


== History ==
[[Image:34ide-outview.jpg | right | border |350px]]
34ID-E is an [[wikipedia:undulator | undulator]] [[wikipedia:Beamline#Synchrotron_radiation_beamline | beamline]] dedicated to [[wikipedia:x-ray|x-ray]] micro/nano-diffraction activities at the [[Wikipedia:Advanced Photon Source | Advanced Photon Source]] (APS).


''Main article: [[History of Beamline 34ID-E]]''
The x-ray micro/nano-diffraction facility [[X-ray Focusing at 34ID-E | focuses]] x-ray beam to smaller than 0.5&mu;m &times; 0.5&mu;m for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.


People started to build 34ID a long time ago, probably around 1500 B.C.
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-&mu;m resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  


== Overview ==
34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.


=== Beam Parameters ===
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].
<!-- Contents of the Overview Panel ends here -->
|}
|}
<!-- END of Overview Panel -->


{|class = "wikitable"
<!-- Instrument Panel -->
|-  
{| id="mp-ins" style="margin:4px 0 0 0; width:100%; background:none; border-spacing: 0px;"
|Source Type || Undulator A 3.3 cm period, 2.5 m
| class="MainPageBG" style="width:100%; border:1px solid #ddd; background:#fff; vertical-align:top; color:#000;" |
{| id="mp-ins-main" style="width:100%; vertical-align:top; background:#fff; color:#000;"
| style="padding:2px;" colspan=2 | <h2 id="mp-tfl-h2" style="margin:3px; background:#ddd; font-size:120%; font-weight:bold; border:1px solid #aaa; text-align:left; color:#000; padding:0.2em 0.4em">Instruments</h2>
|-
| style="color:#000; padding:2px 5px; vertical-align:top;" |
<!-- left part of Instrument Panel -->
<div style="padding-left:80px;">'''Beam Parameters'''</div>
<!-- Beam Parameters Table -->
{|border="1" cellpadding="4" cellspacing="0" style="width:300px;margin:1em 1em 1em 0; background:none; border:2px #aaa solid;border-collapse: collapse;"
|-
|Source Type || Undulator A, 3.3 cm
|-  
|-  
|Energy Range || 7 - 30 keV
|Energy Range || 7 - 30 keV
|-  
|-  
|Beam Size || 300 nm x 300 nm
|Beam Size || 300 - 500 nm (H) <br> 300 - 700 nm (V)
|-  
|-  
|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
|Energy Resolution (&Delta;E/E) || 1 &times; 10<sup>-4</sup>
Line 30: Line 67:
|1 &times; 10<sup>9</sup> (mono)
|1 &times; 10<sup>9</sup> (mono)
|}
|}
<!-- END Beam Parameters Table -->
<!-- END left part of Instrument Panel -->
|
<!-- right part of Instrument Panel -->
<!-- Beamline Diagram -->
{| style="border-collapse:collapse;padding:0"
|-
|style="padding:0;"|[[Image:34ide-diagram-topleft.png|link=]]
|style="padding:10px;"| [[34ID-E Detectors | Detectors]]
|colspan=2|
<div>''Main Articles:''</div>
* '''[[34ID Beamline Layout]]'''
* '''[[34ID-E Experiment Station]]'''
|-
|style="padding:0;"|[[Image:34ide-diagram-left.png|link=]]
|style="padding:0;" colspan="3"|[[Image:34ide-diagram-right.png|link=]]
|style="text-align:center"|[[ff | Undulator<br>Source]]
|-
|style="text-align:right;padding:0px 70px 10px 0px;"|[[Differential Aperture]]
|style="width:240px;"|[[X-ray Focusing at 34ID-E | Focusing Mirrors]]
|style="width:100px;text-align:center;vertical-align:top"|[[Monochromator of 34ID-E | Removable<br>Monochromator]]
|style="visibility:hidden;"| empty cell
|}
<!-- END Beamline Diagram -->
<!-- END right part of Instrument Panel -->
|}
|}
<!-- END of Instrument Panel -->


=== Contacts ===


== Instrumentation ==
<!-- Boxes of Categories -->
''Main articles: [[34ID Beamline Layout]] and [[34ID E-Station]]''
<!-- derived from Wikipedia's TODAY'S FEATURED CONTENT  -->
{| id="mp-cat" style="width: 100%; margin:4px 0 0 0; background:none; border-spacing: 0px;"
<!-- Left Part -->
| class="MainPageBG" style="width:50%; border:1px solid #cedff2; background:#f5faff; vertical-align:top;"|
{| id="mp-cat-left" style="width:100%; vertical-align:top; background:#f5faff;"
| style="padding:2px;" | <h2 id="mp-itn-h2" style="margin:3px; background:#cedff2; font-size:120%; font-weight:bold; border:1px solid #a3b0bf; text-align:left; color:#000; padding:0.2em 0.4em;">General Info</h2>
|-
| style="color:#000; padding:2px 5px 5px;" |


=== Operations ===
* Who built 34ID-E? Is the beamline more than 300 years old? ''See: [[History of Beamline 34ID-E]]''
* [[34ID-E Coordinate Systems]]
* [[Computing Infrastructure of 34ID-E | Beamline computing infrastructure]]
* [[References for 34ID-E | References / Review articles about 34ID-E]]
* How to [[Applying for beam time at 34ID-E | apply for beam time]]?


== Data Analysis ==
|}
| style="border:1px solid transparent;" |
<!--  Right part -->
| class="MainPageBG" style="width:50%; border:1px solid #cef2e0; background:#f5fffa; vertical-align:top; color:#000;" |
{| id="mp-right" style="width:100%; vertical-align:top; background:#f5fffa;"
| style="padding:2px;" | <h2 id="mp-tfa-h2" style="margin:3px; background:#cef2e0; font-size:120%; font-weight:bold; border:1px solid #a3bfb1; text-align:left; color:#000; padding:0.2em 0.4em;"> Beamline Control</h2>
|-
| style="color:#000; padding:2px 5px" |


''See: [[LaueGo]]''
* [http://www.aps.anl.gov/epics/ EPICS]
* [[34ID-E Control Interface]]


Experimental data taken with our area detectors are saved in the [http://www.nexusformat.org/ NeXus format] based on [http://en.wikipedia.org/wiki/Hierarchical_Data_Format HDF-5].
|-
| style="padding:2px;" | <h2 id="mp-dyk-h2" style="margin:3px; background:#cef2e0; font-size:120%; font-weight:bold; border:1px solid #a3bfb1; text-align:left; color:#000; padding:0.2em 0.4em;">[[34ID-E Data Analysis Overview|Data Analysis]]</h2>
|-
| style="color:#000; padding:2px 5px 5px;" |


Analysis and visualization are mostly done with '''[[LaueGo]]''', a package developed at 34ID-E based on [[IGOR Pro]], runs on any PC or Mac.
* [[34ID-E Data Analysis Overview | Data Analysis Overview]]
 
* '''[[LaueGo]]''', main data analysis package based on [[IGOR Pro]].
 
* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]].
 
|}
|}
<!-- END Boxes of Categories -->


Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]], which is carried out by a multi-node Linux cluster at APS.


== External Links ==
== External Links ==
*[http://www.aps.anl.gov/Sectors/33_34/microdiff/index.html 34ID-E Homepage]
*[http://www.aps.anl.gov/Sectors/33_34/microdiff/index.html 34ID-E Homepage]
*[http://sector33.xray.aps.anl.gov/34ide/status.cgi 34ID-E real-time status]
*[http://sector33.xray.aps.anl.gov/34ide/status.cgi 34ID-E real-time status page]
*[http://www.aps.anl.gov/Sectors/33_34/ Surface Scattering and Microdiffraction Group]
*[http://www.aps.anl.gov/Sectors/33_34/ Surface Scattering and Microdiffraction Group]
*[http://www.aps.anl.gov/ Advanced Photon Source] and [http://www.anl.gov Argonne National Laboratory]
*[http://www.aps.anl.gov/ Advanced Photon Source] and [http://www.anl.gov Argonne National Laboratory]
*[http://www.aps.anl.gov/Beamlines/Directory/ APS Beamline Directory] and [http://www.aps.anl.gov/Beamlines/Phone_Directory/ Phone Numbers]
*[http://www.aps.anl.gov/Beamlines/Directory/ APS Beamline Directory] and [http://www.aps.anl.gov/Beamlines/Phone_Directory/ Phone Numbers]

Latest revision as of 21:21, 19 August 2013


Welcome to 34ID-E Wiki.

Contacts:

Overview

34ide-outview.jpg

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Instruments

Beam Parameters
Source Type Undulator A, 3.3 cm
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H)
300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
34ide-diagram-topleft.png Detectors
Main Articles:
34ide-diagram-left.png 34ide-diagram-right.png Undulator
Source
Differential Aperture Focusing Mirrors Removable
Monochromator
empty cell


General Info

Beamline Control

Data Analysis


External Links