Difference between revisions of "34-ID-E"

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Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-&mu;m resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  
Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a [[differential aperture]], spatially resolved microdiffraction measurements can be made in all three dimensions with sub-&mu;m resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.  
After a canting upgrade in 2011, Sector 34ID now has two independent undulators placed in tandem along the storage ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for [[wikipedia:coherent diffraction imaging|coherent diffraction imaging]] experiments.


The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].  
The development of the microbeam experimental capabilities were sponsored by the [[wikipedia:United States Department of Energy|DOE]] [[wikipedia:Office of Science|Office of Science]].  
34ID-E is the inboard branch of Sector 34ID, which is a canted sector with two independent [[wikipedia:undulator | undulators]] positioned in tandem along the synchrotron ring. X-rays generated by them are horizontally separated, and the ourboard branch is used by 34ID-C for coherent diffraction imaging experiments.


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Revision as of 04:18, 9 August 2013


Welcome to 34ID-E Wiki.

Overview

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source.

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

After a canting upgrade in 2011, Sector 34ID now has two independent undulators placed in tandem along the storage ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes into 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Beam Parameters
Source Type Undulator A, 3.3 cm period, 2.2 m
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H) × 300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
Contacts

Instruments


Miscellaneous

Beamline Control

Data Analysis

  • Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.
  • Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.


External Links

Retrieved from "https://wiki-ext.aps.anl.gov/s34ide/index.php?title=34-ID-E&oldid=76"