Difference between revisions of "34-ID-E"

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* Wenjun Liu
* Wenjun Liu
* [[User:Ruqingxu | Ruqing Xu]]
* [[User:Ruqingxu | Ruqing Xu]]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler]
* [http://sector33.xray.aps.anl.gov/~tischler/ Jon Tischler] (Group Leader)

== Instrumentation ==
== Instrumentation ==

Revision as of 19:50, 8 August 2013

Welcome to 34ID-E Wiki.

34ID-E is the x-ray microdiffraction beamline at the APS. Diffraction of monochromatic and polychromatic micro-focused x-ray beam is used to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics.


Main article: History of Beamline 34ID-E

People started to build 34ID a long time ago, although most likely not earlier than 1500 B.C.


Beam Parameters

Source Type Undulator A 3.3 cm period, 2.5 m
Energy Range 7 - 30 keV
Beam Size 300 nm x 300 nm
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)



Main articles: 34ID Beamline Layout and 34ID E-Station


Main article: 34ID-E Control Interface

Data Analysis

See: LaueGo

Experimental data taken with our area detectors are saved in the NeXus format based on HDF-5.

Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on IGOR Pro, runs on any PC or Mac.

Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.

External Links