|(36 intermediate revisions by the same user not shown)|
'''Welcome to 34ID- E!'''
Beamline 34ID-E uses monochromatic and polychromatic micro- beam diffraction to examine the structure of materials with sub- micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid- solution precipitation, high pressure environments, and condensed matter physics
Data Analysis ==