Difference between revisions of "34-ID-E"
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Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]], which is carried out by a multi-node Linux cluster at APS. | Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]], which is carried out by a multi-node Linux cluster at APS. | ||
== External Links == | |||
*[http://www.aps.anl.gov/Sectors/33_34/microdiff/index.html 34ID-E Homepage] | |||
*[http://sector33.xray.aps.anl.gov/34ide/status.cgi 34ID-E real-time status] | |||
*[http://www.aps.anl.gov/Sectors/33_34/ Surface Scattering and Microdiffraction Group] | |||
*[http://www.aps.anl.gov/ Advanced Photon Source] and [http://www.anl.gov Argonne National Laboratory] | |||
*[http://www.aps.anl.gov/Beamlines/Directory/ APS Beamline Directory] and [http://www.aps.anl.gov/Beamlines/Phone_Directory/ Phone Numbers] |
Revision as of 19:00, 6 August 2013
Welcome to the 34ID-E wiki! This is the main page.
Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
Overview
Beam Parameters
Contacts
Instrumentation
Main articles: 34ID Beamline Layout and 34ID E-Station
Operations
Data Analysis
See: LaueGo
Experimental data taken with our area detectors are saved in the NeXus format based on HDF-5.
Analysis and visualization are mostly done with LaueGo, a package developed at 34ID-E based on Igor Pro, runs on any PC or Mac.
Data from depth-resolved measurements requires reconstruction, which is carried out by a multi-node Linux cluster at APS.