Difference between revisions of "34-ID-E"
From 34-ID-E
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'''Welcome to 34ID-E!''' | '''Welcome to the 34ID-E wiki!''' This is the main page. | ||
Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. | Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. | ||
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The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics | The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics | ||
==Overview== | == Overview == | ||
== | === Beam Parameters === | ||
=== Contacts === | |||
==Experimental Hutch== | ==Experimental Hutch== | ||
==User | === User Operation === | ||
== Data Analysis == | == Data Analysis == | ||
[[DataAnalysis]] | [[DataAnalysis]] | ||
===LaueGo=== | |||
{{DataAnalysis}} | {{DataAnalysis}} | ||
Revision as of 21:43, 3 August 2013
Welcome to the 34ID-E wiki! This is the main page.
Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
Overview
Beam Parameters
Contacts
Experimental Hutch
User Operation
Data Analysis
LaueGo
Reconstruction
Peak Search
Indexing
LaueGo
