34-ID-E

Welcome to 34ID-E Wiki.

Contacts:

Wenjun Liu Ruqing Xu Jon Tischler

Overview 34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS). The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample. Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains. 34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments. The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Instruments Beam Parameters Source Type Undulator A, 3.3 cm Energy Range 7 - 30 keV Beam Size 300 - 500 nm (H) 300 - 700 nm (V) Energy Resolution (ΔE/E) 1 × 10-4 Beam Flux (photons/sec) 1 × 1011 (white) 1 × 109 (mono) Detectors Main Articles: 34ID Beamline Layout 34ID-E Experiment Station Undulator Source Differential Aperture Focusing Mirrors Removable Monochromator empty cell

General Info Who built 34ID-E? Is the beamline more than 300 years old? See: History of Beamline 34ID-E 34ID-E Coordinate Systems Beamline computing infrastructure References / Review articles about 34ID-E How to apply for beam time?

Beamline Control EPICS 34ID-E Control Interface Data Analysis Data Analysis Overview LaueGo, our main data analysis package. Data from depth-resolved measurements requires reconstruction.

External Links

• 34ID-E Homepage
• 34ID-E real-time status page
• Surface Scattering and Microdiffraction Group
• Advanced Photon Source and Argonne National Laboratory
• APS Beamline Directory and Phone Numbers