Difference between revisions of "34-ID-E"
From 34-ID-E
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'''Welcome to 34ID-E!''' | |||
Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains. | |||
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics | |||
==Overview== | |||
==Beamline Parameters== | |||
==Experimental Hutch== | |||
==User Operations== | |||
==Contacts== | |||
== Data Analysis == | |||
[[DataAnalysis]] | |||
{{DataAnalysis}} | {{DataAnalysis}} | ||
Revision as of 21:38, 3 August 2013
Welcome to 34ID-E!
Beamline 34ID-E uses monochromatic and polychromatic micro-beam diffraction to examine the structure of materials with sub-micron spatial resolution in all three dimensions. Properties that can be measured include local crystallographic orientations, orientation gradients and strains.
The science area brings together a very large and scientifically diverse community with interests in materials deformation processes, recrystallization, electromigration, solid-solution precipitation, high pressure environments, and condensed matter physics
Overview
Beamline Parameters
Experimental Hutch
User Operations
Contacts
Data Analysis
Reconstruction
Peak Search
Indexing
LaueGo
