Difference between revisions of "34-ID-E"

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* Experimental data taken with our [[34ID-E Detectors|area detectors]] are saved in the [http://www.nexusformat.org/ NeXus format] based on [[wikipedia:Hierarchical Data Format | HDF-5]].
* [[34ID-E Data Analysis Overview | Data Analysis Overview]]


* Analysis and visualization are mostly done with '''[[LaueGo]]''', a package developed at 34ID-E based on [[IGOR Pro]], runs on any PC or Mac.
* '''[[LaueGo]]''', our main data analysis package.


* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]], which is carried out by a multi-node Linux cluster at APS.
* Data from depth-resolved measurements requires [[Reconstruction of Depth-Profiling Data | reconstruction]].


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Revision as of 19:59, 19 August 2013


Welcome to 34ID-E Wiki.

Contacts:

Overview

34ide-outview.jpg

34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.

Instruments

Beam Parameters
Source Type Undulator A, 3.3 cm
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H)
300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
34ide-diagram-topleft.png Detectors
Main Articles:
34ide-diagram-left.png 34ide-diagram-right.png Undulator
Source
Differential Aperture Focusing Mirrors Removable
Monochromator 		empty cell


General Info

Beamline Control

Data Analysis

  • LaueGo, our main data analysis package.


External Links

Retrieved from "https://wiki-ext.aps.anl.gov/s34ide/index.php?title=34-ID-E&oldid=139"