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Welcome to 34ID-E Wiki.




34ID-E is an undulator beamline dedicated to x-ray micro/nano-diffraction activities at the Advanced Photon Source (APS).

The x-ray micro/nano-diffraction facility focuses x-ray beam to smaller than 0.5μm × 0.5μm for use in diffraction techniques using Kirkpatrick-Baez (K-B) mirrors. A specially designed micro-monochromator allows the selection of either polychromatic or monochromatic conditions with a fixed focal spot on the sample.

Polychromatic x-ray microscopy utilizes Laue diffraction method to characterize crystalline structure in materials. By scanning a differential aperture, spatially resolved microdiffraction measurements can be made in all three dimensions with sub-μm resolution. Properties that can be measured include the local crystalline phase, local texture (orientation), and the local strains.

34ID-E is part of Sector 34ID. After a canting upgrade in 2011, 34ID now has two independently-operated undulators placed in tandem along the ring. X-rays generated by them are horizontally separated. 34ID-E takes the inboard beam, while the outboard beam goes to 34ID-C for coherent diffraction imaging experiments.

The development of the microbeam experimental capabilities were sponsored by the DOE Office of Science.


Beam Parameters
Source Type Undulator A, 3.3 cm
Energy Range 7 - 30 keV
Beam Size 300 - 500 nm (H)
300 - 700 nm (V)
Energy Resolution (ΔE/E) 1 × 10-4
Beam Flux (photons/sec) 1 × 1011 (white)
1 × 109 (mono)
34ide-diagram-topleft.png Detectors
Main Articles:
34ide-diagram-left.png 34ide-diagram-right.png Undulator
Differential Aperture Focusing Mirrors Removable
empty cell

General Info

Beamline Control

Data Analysis

External Links