Difference between revisions of "Diffraction"

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Revision as of 14:19, 8 September 2010 (view source)
Mvholt (talk | contribs)
(→‎For Users)
 
Revision as of 22:05, 9 January 2014 (view source)
Ktietz (talk | contribs)
(Created page with "Back to X-Ray Microscopy ===For Users === *Sample Alignment Quick Reference *Scanning Probe Diffraction Quick Reference *Data Analysis Quick Reference ===Nanopr...")
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Revision as of 22:05, 9 January 2014

Back to X-Ray Microscopy

Contents

  • 1 For Users
  • 2 Nanoprobe Instrument
  • 3 Detectors
  • 4 Optics
  • 5 Links

For Users

  • Sample Alignment Quick Reference
  • Scanning Probe Diffraction Quick Reference
  • Data Analysis Quick Reference

Nanoprobe Instrument

  • Focusing optics module (FOM)
  • Condenser module (CM)
  • Imaging optics module (IOM)
  • Sample module (SM)
  • NPI Manuals
  • Manual for Nanoprobe Instrument

Detectors

  • Coolsnap
  • PIXIS 1024XF
  • PI-LCX
  • MAR185

Optics

  • Focusing zone plates
  • Imaging zone plates


Links

X-ray Data Booklet DataBook Image Small.jpg
Bragg law calculator
X-ray interactions with matter

Retrieved from "https://wiki-ext.aps.anl.gov/s26id/index.php?title=Diffraction&oldid=6"
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