Difference between revisions of "Diffraction"
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===For Users === | ===For Users === | ||
Revision as of 22:31, 9 January 2014
Back to X-Ray Microscopy
For Users
- Sample Alignment Quick Reference
- Scanning Probe Diffraction Quick Reference
- Data Analysis Quick Reference
Nanoprobe Instrument
- Focusing optics module (FOM)
- Condenser module (CM)
- Imaging optics module (IOM)
- Sample module (SM)
- NPI Manuals
- Manual for Nanoprobe Instrument
Detectors
Optics
Links
X-ray Data Booklet
Bragg law calculator
X-ray interactions with matter
